Understanding the Residual Stress in DMLS CoCrMo and SS316L using X-ray diffraction

Depth-resolved residual stress evaluation from X-ray diffraction measurement data using the approximate inverse method

The paper deals with the depth determination of residual stress states from diffraction data. First an historical overview of the known approaches is given. Then we apply the approximate inverse method to this problem. This method is known to be very efficient and stable with respect to noise-contaminated data. It is even possible to prove convergence and it allows an error estimate of the calc...

The interaction of fatigue cracks with a residual stress field using thermoelastic stress analysis and synchrotron X-ray diffraction experiments

This article presents an experimental study on the fatigue behaviour of cracks emanating from cold-expanded holes utilizing thermoelastic stress analysis (TSA) and synchrotron X-ray diffraction (SXRD) techniques with the aim of resolving the long-standing ambiguity in the literature regarding potential relaxation, or modification, of beneficial compressive residual stresses as a result of fatig...

Recent Advances in the Measurement of Residual Stress by X-Ray Diffraction

EVALUATION OFDISLOCATION STRUCTURE AND CRYSTALLITE SIZE IN WORN AL-SI ALLOY BY X-RAY DIFFRACTION

Abstract: powerful method for the characterization of microstructures of crystalline materials in terms of crystallite size anddislocation structures. In this paper the effect of the sliding on the microstructure of A356 in the as-cast and heattreated conditions are studied, The X-ray phase analysis shows that with increasing applied load, the dislocationdensity is increased, whereas the crysta...

Depth dependence of residual strains in polycrystalline Mo thin films using high-resolution x-ray diffraction

The magnitude of the stress in a thin film can be obtained by measuring the curvature of the film–substrate couple. Crystal curvature techniques yield the average stress throughout the film thickness. On a microscopic level, the details of the strain distribution, as a function of depth through the thickness of the film, can have important consequences in governing film quality and ultimate mor...